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Single Objective Oblique Plane Imaging System
NU 2018-182
INVENTORS
Yevgenia Kozorovitskiy*
Manish Kumar
SHORT DESCRIPTION
A novel oblique plane imaging system utilizing a reduced number of objectives to enable the use of low numerical aperture (NA) objectives, thus achieving a compact and cost-effective design while maintaining high-quality imaging performance.
BACKGROUND
Traditional...
Published: 11/6/2025
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Inventor(s):
Keywords(s): 3D imaging, Engineering, Imaging, Microscopy, Optics, Research tool
Category(s): Physical Sciences > Engineering & Technology
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Design and Simulation of a Snapshot Multi Focal Interferometric Microscope
NU 2018-070 InventorsOliver Cossairt*Kuan HeAggelos K. KatsaggelosNorbert ShererMark HereldShort Description3D fluorescent imaging with high temporal and spatial resolutionBackgroundA key hurdle in modern 3D fluorescent imaging is achieving both high temporal and spatial resolution across large volumes. Light microscopes use focal scanning to acquire...
Published: 11/6/2025
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Inventor(s):
Keywords(s): Engineering, Imaging, Instrumentation, Microscopy, Optics, Research tool
Category(s): Physical Sciences > Engineering & Technology
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High-Throughput Imaging of Graphene Based Sheets by Fluorescence Quenching Microscopy
NU 2009-099
Inventors
Laura Cote
Jiaxing Huang*
Franklin Kim
Jaemyung Kim
Short Description
Method for visualizing graphene without special substrates
Abstract
Graphene based sheets have stimulated great interest due to their superior mechanical, electrical and thermal properties. A general visualization method has been developed that...
Published: 11/6/2025
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Inventor(s):
Keywords(s): Graphene, Lithography, Materials, Microscopy
Category(s): Physical Sciences > Materials and Industrial Processes
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An Electron Microscope Imaging Software System for Large-Scale Imaging of Crystalline Materials
NU 2017-016InventorsVinayak P. Dravid*Benjamin MyersKarl A. Hujsak Short DescriptionAn electron microscopy and image processing system for the aquisition and reconstruction of crystalline image data. BackgroundCrystal phase and orientation are crucial microstructural properties that influence the mechanical, electrical, and optical properties of structures...
Published: 11/6/2025
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Inventor(s):
Keywords(s): Analysis, Computer software, Engineering, Microscopy
Category(s): Physical Sciences > Engineering & Technology
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High Speed/Low Dose Multi-Objective Autonomous Scanning Materials Imaging
NU 2017-129 Inventors Karl A. Hujsak Vinayak P. Dravid* Short Description A software package that captures and reconstructs images for electron microscopy analysisBackground Electron microscopy (EM) is fundamental to the study of the structure and composition of micro- to nanometer-structured materials. This length scale encompasses cells, proteins,...
Published: 11/6/2025
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Inventor(s):
Keywords(s): Analysis, Application, Assay, Computer software, Engineering, Instrumentation, Microscopy, Mobile app
Category(s): Physical Sciences > Engineering & Technology
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Method for Performing and Analyzing Multiplexed Bead-Based Assays
NU 2006-022 InventorsAbhishek Mathur David M. Kelso* Short DescriptionNovel system and method for performing high throughput bead-based assays for multiple analytes simultaneously AbstractNorthwestern researchers have developed a method for performing high throughput bead-based assays by establishing a fluorophore-based bar coding system for microbeads....
Published: 11/6/2025
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Inventor(s):
Keywords(s): Assay, Devices, Diagnostics, Medical device, Microscopy, Research tool
Category(s): Life Sciences > Healthcare Devices, Tools & IT
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Bridge Enhanced Nanoscale Impedance Microscopy (BE-NIM)
NU 2005-060InventorsMark Hersam*Liam PingreeShort DescriptionA conductive atomic force microscopy (cAFM) adjunct that is capable of quantitatively measuring the magnitude and phase of alternating current flow through the tip/sample junction with a five order of magnitude improvement in sensitivityAbstractNorthwestern scientists have developed a conductive...
Published: 11/6/2025
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Inventor(s):
Keywords(s): Engineering, Instrumentation, Microscopy, Research tool
Category(s): Physical Sciences > Engineering & Technology
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Nano-cantilever Bi-stable Proximity Sensor/Probe
NU 2004-054 InventorsHoracio D Espinosa* Changhong Ke Nicolaie A Moldovan Short DescriptionA novel feedback controlled bi-stable nano-cantilever as logic switches and sensing deviceAbstractA novel nano-electromechanical system (NEMS) is developed at Northwestern, which has bi-stable states to enable the proximity sensing/probing, on/off logic switch...
Published: 11/6/2025
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Inventor(s):
Keywords(s): Electronics & Circuits, Manufacturing/Processing, Materials, Microscopy, Nanotechnology, Sensors
Category(s): Physical Sciences > Materials and Industrial Processes
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Atomic Force Electroluminescence Microscopy
NU 2004-050InventorsMark Hersam*Liam PingreeShort DescriptionA new atomic force microscope tool, AFEM, capable of gathering simultaneous topographical, current, and electroluminescence information through a commercially available conductive AFM tipBackgroundOrganic light-emitting diodes (OLEDs) receive increasing attention due to their potential use...
Published: 11/6/2025
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Inventor(s):
Keywords(s): Engineering, Instrumentation, Manufacturing/Processing, Materials, Microscopy
Category(s): Physical Sciences > Engineering & Technology
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